News

Cianflone Scientific Instruments Corporation has introduced a new Portaspec bench top model capable of performing multi-element sequential analysis in the range of Ti through U. All functions are operated by a PC Touchscreen Notebook Computer, complete with Windows®-based preinstalled Software. An easy loading two position sample holder is also included.

This wavelength dispersive x-ray fluorescence analyzer is ideal for measuring coating weights of chrome, titanium and zirconium pretreatment, and has expanded the Portaspec's measurement capabilities to include aluminum and phosphorus coatings.

See Product description for additional details.

Upcoming Events

Come and see us at these Upcoming Trade Shows

2008 NCCA FALL TECHNICAL MEETING & TRADE SHOW Marriott New Orleans New Orleans, Louisiana Tuesday,September 23, 2008 4:30 p.m. - 7:00 p.m. www.coilcoating.org

PITTCON® 2009 Chicago, Illinois March 8 - March 13, 2009 www.pittcon.org

Check back later for further details.