News

Cianflone Scientific Instruments Corporation has introduced a new Portaspec bench top model capable of performing multi-element sequential analysis in the range of Ti through U. All functions are operated by a PC Touchscreen Notebook Computer, complete with Windows®-based preinstalled Software. An easy loading two position sample holder is also included.

This wavelength dispersive x-ray fluorescence analyzer is ideal for measuring coating weights of chrome, titanium and zirconium pretreatment, and has expanded the Portaspec's measurement capabilities to include aluminum and phosphorus coatings.

See Product description for additional details.

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